2005

Domain growth kinetics in lithium niobate single crystals studied by piezoresponse force microscopy B. J. Rodriguez, R. J. Nemanich, A. Kingon, A. Gruverman, S. V. Kalinin, K. Terabe, X. Y. Liu, K. Kitamura, Applied Physics Letters 86, 12906, 2005.

Direct studies of domain switching dynamics in thin film ferroelectric capacitors A. Gruverman, B. J. Rodriguez, C. Dehoff, J. D. Waldrep, A. I. Kingon, R. J. Nemanich, J. S. Cross, Applied Physics Letters 87, 82902, 2005.

Electromechanical imaging of biological systems with sub-10 nm resolution S. V. Kalinin, B. J. Rodriguez, S. Jesse, T. Thundat, A. Gruverman, Applied Physics Letters 87, 053901, 2005.

Nanoelectromechanics of polarization switching in piezoresponse force microscopy S. V. Kalinin, A. Gruverman, B. J. Rodriguez, J. Shin, A. P. Baddorf, E. Karapetian, M. Kachanov, Journal of Applied Physics 97, 74305, 2005.

AlN bulk crystals grown on SiC seeds R. Dalmau, R. Schlesser, B. J. Rodriguez, R. J. Nemanich, Z. Sitar, Journal of Crystal Growth 281, 68-74, 2005.

Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors C. Dehoff, B. J. Rodriguez, A. I. Kingon, R. J. Nemanich, A. Gruverman, J. S. Cross, Review of Scientific Instruments 76, 23708, 2005.

Scanning probe investigation of surface charge and surface potential of GaN-based heterostructures B. J. Rodriguez, W.-C. Yang, R. J. Nemanich, A. Gruverman, Applied Physics Letters 86, 112115, 2005.

Investigation of the mechanism of polarization switching in ferroelectric capacitors by three-dimensional piezoresponse force microscopy B. J. Rodriguez, A. Gruverman, A. I. Kingon, R. J. Nemanich, J. S. Cross, Applied Physics A 80, 99-103, 2005.

Simultaneous elastic and electromechanical imaging by scanning probe microscopy: Theory and applications to ferroelectric and biological materials J. Shin, B. J. Rodriguez, A. P. Baddorf, T. Thundat, E. Karapetian, M. Kachanov, A. Gruverman, S. V. Kalinin, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 23, 2102-2108, 2005.

Preparation and characterization of atomically clean, stoichiometric surfaces of AIN (0001) W. J. Mecouch, B. P. Wagner, Z. J. Reitmeier, R. F. Davis, C. Pandarinath, B. J. Rodriguez, R. J. Nemanich, Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 23, 72-77, 2005.

Conservative and Dissipative Force Imaging of Switchable Rotaxanes with Frequency Modulation Atomic Force Microscopy Farrell, A. A., Fukuma, T., Uchihashi, T., Kay, E. R., Bottari, G., Leigh, D. A., Yamada, H., and Jarvis, S. P., Physical Review B 72, 125430, (2005).

Quantitative measurement of solvation shells using frequency modulated atomic force microscopy T. Uchihashi, T., Higgins, M. J., Nakayama, Y., Sader, J. E., and Jarvis, S. P., Nanotechnology 16, S49-S53, (2005).

Quantitative force measurements using frequency modulation atomic force microscopy - theoretical foundations Sader, J. E., Uchihashi, T., Higgins, M. J., Farrell, A., Nakayama, Y., and Jarvis, S. P., Nanotechnology 16, S94-S101, (2005).

Frequency modulation atomic force microscopy: a dynamic measurement technique for biological systems Higgins, M. J., Riener, C. K., Uchihashi, T., Sader, J. E., McKendry, R., and Jarvis, S. P., Nanotechnology 16, S85-S89, (2005).

2004

Three-dimensional high-resolution reconstruction of polarization in ferroelectric capacitors by piezoresponse force microscopy B. J. Rodriguez, A. Gruverman, A. I. Kingon, R. J. Nemanich, J. S. Cross, Journal of Applied Physics 95, 1958-1962, 2004.

Polarization-dependent electron affinity of LiNbO3 surfaces W.-C. Yang, B. J. Rodriguez, A. Gruverman, R. J. Nemanich, Applied Physics Letters 85, 2316-2318, 2004.

In situ cleaning and characterization of oxygen-and zinc-terminated, n-type, ZnO {0001} surfaces Coppa, BJ; Fulton, CC; Hartlieb, PJ; Davis, RF; Rodriguez, BJ; Shields, BJ; Nemanich, RJ; Journal of Applied Physics 95, 5856-5864, 2004.

Initial stages of growth of gallium nitride via iodine vapor phase epitaxy Mecouch, WJ; Rodriguez, BJ; Reitmeier, ZJ; Park, JS; Davis, RF; Sitar, Z; Materials Research Society Symposium Proceedings 831, E3. 23, 2004.

Quantitative force measurements in liquid using frequency modulation atomic force microscopy Uchihashi, T., Higgins, M. J., Yasuda, S., Jarvis, S. P., Akita, S., Nakayama, Y., and Sader, J. E., Applied Physics Letters 85, 3575-3577, (2004).

Interpretation of frequency modulation atomic force microscopy using fractional calculus Sader, J. E., and Jarvis, S. P., Physical Review B 70, 012303, (2004).

Accurate Formulas for Interaction Force and Energy in Frequency Modulation Force Spectroscopy Sader, J. E., and Jarvis, S. P., Applied Physics Letters 84, 1801-1803, (2004).

2003

Mechanical stress effect on imprint behavior of integrated ferroelectric capacitors Gruverman, Alexei; Rodriguez, BJ; Kingon, AI; Nemanich, RJ; Tagantsev, AK; Cross, JS; Tsukada, M; Applied Physics Letters 83, 728-730, 2003.

Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors Gruverman, A; Rodriguez, BJ; Kingon, AI; Nemanich, RJ; Cross, JS; Tsukada, M; Applied Physics Letters 82, 3071-3073, 2003.

Photoelectron emission microscopy observation of inversion domain boundaries of GaN-based lateral polarity heterostructures W.-C. Yang, B. J. Rodriguez, M. Park, R. J. Nemanich, O. Ambacher, V. Cimalla, Journal of Applied Physics 94, 5720-5725, 2003.

Micro-Raman study of electronic properties of inversion domains in GaN-based lateral polarity heterostructures M. Park, J. J. Cuomo, B. J. Rodriguez, W.-C. Yang, R. J. Nemanich, O. Ambacher, Journal of Applied Physics 93, 9542-9547, 2003.

Wavelength-dependent Raman scattering of hydrogenated amorphous silicon carbon with red, green, and blue light excitation M. Park, V. Sakhrani, J. P. Maria, J. J. Cuomo, C. W. Teng, J. F. Muth, M. E. Ware, B. J. Rodriguez, R. J. Nemanich, Journal of Materials Research 18, 768-771, 2003.

Application of carbon nanotubes to topographical resolution enhancement of tapered fiber SNOM probes Huntington, S. T., and Jarvis, S. P., Review of Scientific Instruments 74, 2933-2935, (2003).

2002

Piezoresponse force microscopy for polarity imaging of GaN B. J. Rodriguez, A. Gruverman, A. I. Kingon, R. J. Nemanich, O. Ambacher, Applied Physics Letters 80, 4166-4168, 2002.

Nanoscale observation of photoinduced domain pinning and investigation of imprint behavior in ferroelectric thin films A. Gruverman, B. J. Rodriguez, R. J. Nemanich, A. I. Kingon, Journal of Applied Physics 92, 2734-2739, 2002.

Piezoresponse force microscopy for piezoelectric measurements of III-nitride materials B.J. Rodriguez, A. Gruverman. A.I. Kingon. R.J. Nemanich, Journal of Crystal Growth 246, 252-258, 2002.

2001

Chemical, Electrical, and Structural Properties of Au/Pd Contacts on Chemical Vapor Cleaned p-type GaN Surfaces P. J. Hartlieb, A. Roskowski, B. J. Rodriguez, R. J. Nemanich, R. F. Davis, Materials Research Society Symposium Proceedings 693, I11.40.1, 2001.

Measurement of the effective piezoelectric constant of nitride thin films and heterostructures using scanning force microscopy B. J. Rodriguez, D. J. Kim, A. I. Kingon, R. J. Nemanich, Materials Research Society Symposium Proceedings 693, I9.9.1, 2001.

2000

Spatial variation of ferroelectric properties in Pb(Zr0.3,Ti0.7)O3 thin films studied by atomic force microscopy J. A. Christman, S.-H. Kim, H. Maiwa, J.-P. Maria, B. J. Rodriguez, A. I. Kingon, R. J. Nemanich, Journal of Applied Physics 87, 8031-8034, 2000.